J750 Tester
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J750 Tester
For Advanced Microcontrollers and Consumer SoC Package Test & Wafer Sort
The J750Ex provides highly economical, parallel test solutions for high-performance microcontrollers, consumer SoC devices, and digital wafer sort applications.
All J750 systems are DIB compatible, and the tens of thousands of J750 test programs can be run on the J750Ex. The J750Ex gives you the test throughput, coverage, and performance to handle the next generation of high-volume, low cost devices.
System features includes:
- 200 MHz / 400 Mbps digital
- Up to 1024 digital pins, 96 devices power supplies, and analog test capabilty
- Deep Vector Memory up to 64 LVM
- Enchanced DFT capability with 196 Gbit scan depth and deep diagnostic capture
- Per-pin architecture, pattern-controlled instrumention, and flexible site mapping with no slot boundaries
- IG-XL™ test software for rapid program development that automatically scales to multisite
I/O Channels |
Up to 512 or 1024
|
Data Rate | Up to 100 MHz |
High Voltage Drivers |
1 per 16 digital channels
|
Parallel Test Site Count (max) |
Greater than x256
|
Vector Memory Depth |
Up to 16M per pin with integrated SCAN
|
Device Power Supplies |
Up to 32 power supplies
|
Scan Depth | Up to 49 Gbit |
Software | IG-XL Software |