Dynamic Test Handler
Incorporates new high-speed handling technologies, this memory handler achieves high speed and stable operation

The M6771AD adopts high-speed handling technologies, and simultaneously tests 32/64 devices. The high throughput of up to 7,200 devices per hour, achieves a greatly decreased test cost. The M6771AD reduces also machine index time to further boost productivity, by speed up of the test tray transfer system.

 
Specifications
Target Packages CSP, TSOP, QFP, BGA, etc
Simultaneous Testing Up to 64 devices
Throughput Up to 7,200 devices per hour
Temperature Ranges -30 to +125 degrees C
 
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